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"On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware ..."
Jan Burchard et al. (2018)
- Jan Burchard, Dominik Erb, Sudhakar M. Reddy, Adit D. Singh, Bernd Becker:
On the Generation of Waveform-Accurate Hazard and Charge-Sharing Aware Tests for Transistor Stuck-Off Faults in CMOS Logic Circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(10): 2152-2165 (2018)
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