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ORCID"Test Sets for Robust Path Delay Fault Testing on Two-Rail Logic Circuits."
Kazuteru Namba, Hideo Ito (2011)
- Kazuteru Namba, Hideo Ito:
Test Sets for Robust Path Delay Fault Testing on Two-Rail Logic Circuits. IEEE Trans. Computers 60(10): 1459-1470 (2011)
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