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"RDIS: Tolerating Many Stuck-At Faults in Resistive Memory."

Rakan Maddah, Rami G. Melhem, Sangyeun Cho (2015)

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DOI: 10.1109/TC.2013.2295825

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
  - journals/tc/MaddahMC15
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  persistent URL:
  - https://dblp.org/rec/journals/tc/MaddahMC15
Rakan Maddah, Rami G. Melhem, Sangyeun Cho:
RDIS: Tolerating Many Stuck-At Faults in Resistive Memory. IEEE Trans. Computers 64(3): 847-861 (2015)

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