"A Minimal Universal Test Set for Self-Test of EXOR-Sum-of-Products Circuits."

Ugur Kalay, Douglas V. Hall, Marek A. Perkowski (2000)

Details and statistics

DOI: 10.1109/12.841130

access: closed

type: Journal Article

metadata version: 2017-05-20

a service of  Schloss Dagstuhl - Leibniz Center for Informatics