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"Testing Open Defects in Memristor-Based Memories."

Said Hamdioui, Mottaqiallah Taouil, Nor Zaidi Haron (2015)

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DOI: 10.1109/TC.2013.206

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
  - journals/tc/HamdiouiTH15
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  persistent URL:
  - https://dblp.org/rec/journals/tc/HamdiouiTH15
Said Hamdioui, Mottaqiallah Taouil, Nor Zaidi Haron:
Testing Open Defects in Memristor-Based Memories. IEEE Trans. Computers 64(1): 247-259 (2015)

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