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"Automated Test Generation for Debugging Multiple Bugs in Arithmetic Circuits."

Farimah Farahmandi, Prabhat Mishra (2019)

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DOI: 10.1109/TC.2018.2868362

access: closed

type: Journal Article

metadata version: 2023-08-28

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Farimah Farahmandi, Prabhat Mishra:
Automated Test Generation for Debugging Multiple Bugs in Arithmetic Circuits. IEEE Trans. Computers 68(2): 182-197 (2019)

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