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"Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time ..."

Linfeng Chen, Aijiao Cui, Chip-Hong Chang (2015)

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DOI: 10.1109/TC.2015.2401019

access: closed

type: Journal Article

metadata version: 2020-06-15

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  persistent URL:
  - https://dblp.org/rec/journals/tc/ChenCC15
Linfeng Chen, Aijiao Cui, Chip-Hong Chang:
Design of Optimal Scan Tree Based on Compact Test Patterns for Test Time Reduction. IEEE Trans. Computers 64(12): 3417-3429 (2015)

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