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"Deep Metric Learning for Visual Understanding: An Overview of Recent Advances."

Jiwen Lu, Junlin Hu, Jie Zhou (2017)

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DOI: 10.1109/MSP.2017.2732900

access: closed

type: Journal Article

metadata version: 2021-07-25

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Jiwen Lu, Junlin Hu, Jie Zhou:
Deep Metric Learning for Visual Understanding: An Overview of Recent Advances. IEEE Signal Process. Mag. 34(6): 76-84 (2017)

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