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"Random pattern testable design with partial circuit duplication and ..."

Hiroshi Yokoyama, Xiaoqing Wen, Hideo Tamamoto (1999)

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DOI: 10.1002/(SICI)1520-684X(199905)30:5<18::AID-SCJ3>3.0.CO;2-O

access: closed

type: Journal Article

metadata version: 2023-09-13

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Hiroshi Yokoyama, Xiaoqing Wen, Hideo Tamamoto:
Random pattern testable design with partial circuit duplication and I_DDQ testing. Syst. Comput. Jpn. 30(5): 18-27 (1999)

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