"Logic circuit design for testability using orthonormal expansions."

Ryuichi Takahashi, Takashi Nanya (1995)

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DOI: 10.1002/SCJ.4690261101

access: closed

type: Journal Article

metadata version: 2023-09-13

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Ryuichi Takahashi, Takashi Nanya:
Logic circuit design for testability using orthonormal expansions. Syst. Comput. Jpn. 26(11): 1-11 (1995)

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