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"An enhanced fault model for high defect coverage."

Junzhi Sang et al. (2001)

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DOI: 10.1002/SCJ.1032

access: closed

type: Journal Article

metadata version: 2023-09-13

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  - https://dblp.org/rec/journals/scjapan/SangSTKH01
Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi:
An enhanced fault model for high defect coverage. Syst. Comput. Jpn. 32(6): 36-44 (2001)

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