"Continuous and high coverage self-testing of dynamically re-configurable ..."

A. C. Zawada, Nicholas Luke Seed, Peter A. Ivey (2002)

Details and statistics

DOI: 10.1016/S0167-8191(02)00112-6

access: closed

type: Journal Article

metadata version: 2020-02-22

a service of  Schloss Dagstuhl - Leibniz Center for Informatics