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"Transient voltage overshoot in TLP testing - Real or artifact?"

David Trémouilles et al. (2007)

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DOI: 10.1016/J.MICROREL.2006.11.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/TremouillesTRNVG07
David Trémouilles, Steven Thijs, Philippe Roussel, M. I. Natarajan, Vesselin K. Vassilev, Guido Groeseneken:
Transient voltage overshoot in TLP testing - Real or artifact? Microelectron. Reliab. 47(7): 1016-1024 (2007)

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