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"The characterization of retention properties of metal-ferroelectric ..."

Yu-Di Su, Wen-Chieh Shih, Joseph Ya-min Lee (2007)

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DOI: 10.1016/J.MICROREL.2007.01.048

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yu-Di Su, Wen-Chieh Shih, Joseph Ya-min Lee:
The characterization of retention properties of metal-ferroelectric (PbZr_0.53Ti_0.47O₃)-insulator (Dy₂O₃, Y₂O₃)-semiconductor devices. Microelectron. Reliab. 47(4-5): 619-622 (2007)

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