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"Key reliability concerns with lead-free connectors."

Tadahiro Shibutani et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.004

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/ShibutaniWYP08
Tadahiro Shibutani, Ji Wu, Qiang Yu, Michael G. Pecht:
Key reliability concerns with lead-free connectors. Microelectron. Reliab. 48(10): 1613-1627 (2008)

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