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"Integration-based approach to evaluate the sub-threshold slope of MOSFETs."

Adelmo Ortiz-Conde et al. (2010)

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DOI: 10.1016/J.MICROREL.2009.11.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/Ortiz-CondeGLH10
Adelmo Ortiz-Conde, Francisco J. García-Sánchez, Juin J. Liou, Ching-Sung Ho:
Integration-based approach to evaluate the sub-threshold slope of MOSFETs. Microelectron. Reliab. 50(2): 312-315 (2010)

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