Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"High temperature reliability of μtrench Phase-Change Memory devices."

Gabriele Navarro et al. (2012)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2012.06.017

access: closed

type: Journal Article

metadata version: 2023-10-31

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/NavarroSPSNJADCPS12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/NavarroSPSNJADCPS12
Gabriele Navarro, Sarra Souiki, Alain Persico, Veronique Sousa, Jean-François Nodin, Carine Jahan, François Aussenac, Vincent Delaye, Olga Cueto, Luca Perniola, Barbara De Salvo:
High temperature reliability of μtrench Phase-Change Memory devices. Microelectron. Reliab. 52(9-10): 1928-1931 (2012)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.