Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"EBSD measurements of elastic strain fields in a GaN/sapphire structure."

J. F. Luo et al. (2006)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2005.05.012

access: closed

type: Journal Article

metadata version: 2020-12-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/LuoJZZWLNHGS06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/LuoJZZWLNHGS06
J. F. Luo, Yuan Ji, T. X. Zhong, Y. Q. Zhang, J. Z. Wang, J. P. Liu, N. H. Niu, J. Han, X. Guo, G. D. Shen:
EBSD measurements of elastic strain fields in a GaN/sapphire structure. Microelectron. Reliab. 46(1): 178-182 (2006)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.