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"Thermal reliability of VCO using InGaP/GaAs HBTs."

Xiang Liu, Jiann-Shiun Yuan, Juin J. Liou (2011)

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DOI: 10.1016/J.MICROREL.2011.07.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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Xiang Liu, Jiann-Shiun Yuan, Juin J. Liou:
Thermal reliability of VCO using InGaP/GaAs HBTs. Microelectron. Reliab. 51(12): 2147-2152 (2011)

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