Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"A method to recover critical bits under a double error in SEC-DED ..."

Shanshan Liu et al. (2017)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2017.04.020

access: closed

type: Journal Article

metadata version: 2023-05-10

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/LiuRXM17
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/LiuRXM17
Shanshan Liu, Pedro Reviriego, Liyi Xiao, Juan Antonio Maestro:
A method to recover critical bits under a double error in SEC-DED protected memories. Microelectron. Reliab. 73: 92-96 (2017)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.