Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Process variation dependence of total ionizing dose effects in bulk nFinFETs."

Bo Li et al. (2018)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2018.07.020

access: closed

type: Journal Article

metadata version: 2021-09-23

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/LiHYZZLZBYLHW18
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/LiHYZZLZBYLHW18
Bo Li, Yunbo Huang, Ling Yang, Qingzhu Zhang, Zhongshan Zheng, Binhong Li, Huiping Zhu, Jianhui Bu, Huaxiang Yin, Jiajun Luo, Zhengsheng Han, Haibin Wang:
Process variation dependence of total ionizing dose effects in bulk nFinFETs. Microelectron. Reliab. 88-90: 946-951 (2018)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.