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"The impact of BTI aging on the reliability of level shifters in nano-scale ..."

Basel Halak, Vasileios Tenentes, Daniele Rossi (2016)

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DOI: 10.1016/J.MICROREL.2016.10.018

access: closed

type: Journal Article

metadata version: 2020-03-27

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Basel Halak, Vasileios Tenentes, Daniele Rossi:
The impact of BTI aging on the reliability of level shifters in nano-scale CMOS technology. Microelectron. Reliab. 67: 74-81 (2016)

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