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"Reliability of optoelectronics components: towards new qualification ..."

Jean-Luc Goudard et al. (2003)

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DOI: 10.1016/S0026-2714(03)00297-X

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jean-Luc Goudard, X. Boddaert, J. Périnet, Dominique Laffitte:
Reliability of optoelectronics components: towards new qualification practices. Microelectron. Reliab. 43(9-11): 1767-1769 (2003)

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