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"Effect of electrical and thermal stress on low-frequency noise ..."

X. Y. Chen, A. Pedersen, A. D. van Rheenen (2001)

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DOI: 10.1016/S0026-2714(00)00201-8

access: closed

type: Journal Article

metadata version: 2020-02-22

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X. Y. Chen, A. Pedersen, A. D. van Rheenen:
Effect of electrical and thermal stress on low-frequency noise characteristics of laser diodes. Microelectron. Reliab. 41(1): 105-110 (2001)

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