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"Extraction of bias-dependent parasitic source/drain resistance in MOSFETs ..."

Yang-Hua Chang, Kun-Ying Yang (2010)

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DOI: 10.1016/J.MICROREL.2009.11.011

access: closed

type: Journal Article

metadata version: 2020-02-22

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Yang-Hua Chang, Kun-Ying Yang:
Extraction of bias-dependent parasitic source/drain resistance in MOSFETs with an advanced mobility model. Microelectron. Reliab. 50(2): 174-178 (2010)

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