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"Combinatorial methods for the evaluation of yield and operational ..."

Juan A. Carrasco, Víctor Suñé (2004)

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DOI: 10.1016/S0026-2714(03)00216-6

access: closed

type: Journal Article

metadata version: 2020-02-22

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Juan A. Carrasco, Víctor Suñé:
Combinatorial methods for the evaluation of yield and operational reliability of fault-tolerant systems-on-chip. Microelectron. Reliab. 44(2): 339-350 (2004)

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