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"Current transport mechanisms and trap state investigations in ..."

Engin Arslan et al. (2011)

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DOI: 10.1016/J.MICROREL.2010.09.017

access: closed

type: Journal Article

metadata version: 2022-10-02

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  - https://dblp.org/rec/journals/mr/ArslanBSCYO11
Engin Arslan, Serkan Bütün, Yasemin Safak, Hüseyin Çakmak, Hongbo Yu, Ekmel Özbay:
Current transport mechanisms and trap state investigations in (Ni/Au)-AlN/GaN Schottky barrier diodes. Microelectron. Reliab. 51(3): 576-580 (2011)

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