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"Current degradation due to electromechanical coupling in GaN HEMT's."

Balaji Padmanabhan, Dragica Vasileska, Stephen Marshall Goodnick (2013)

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DOI: 10.1016/J.MEJO.2013.03.009

access: closed

type: Journal Article

metadata version: 2021-10-14

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  - https://dblp.org/rec/journals/mj/PadmanabhanVG13
Balaji Padmanabhan, Dragica Vasileska, Stephen Marshall Goodnick:
Current degradation due to electromechanical coupling in GaN HEMT's. Microelectron. J. 44(7): 592-597 (2013)

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