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"Circuit yield optimization by analyzing performance statistics."

Helmut E. Graeb, Reiner E. Lederle (1992)

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DOI: 10.1016/0165-6074(92)90389-O

access: closed

type: Journal Article

metadata version: 2020-05-19

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  - journals/jsa/GraebL92
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  - https://dblp.org/rec/journals/jsa/GraebL92
Helmut E. Graeb, Reiner E. Lederle:
Circuit yield optimization by analyzing performance statistics. Microprocess. Microprogramming 35(1-5): 697-703 (1992)

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