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"From Process Variations to Reliability: A Survey of Timing of Digital ..."

Bing Li, Masanori Hashimoto, Ulf Schlichtmann (2018)

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DOI: 10.2197/IPSJTSLDM.11.2

access: closed

type: Journal Article

metadata version: 2022-01-03

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Bing Li, Masanori Hashimoto, Ulf Schlichtmann:
From Process Variations to Reliability: A Survey of Timing of Digital Circuits in the Nanometer Era. IPSJ Trans. Syst. LSI Des. Methodol. 11 (2018)

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