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"Transformation invariance in pattern recognition: Tangent distance and ..."

Patrice Y. Simard et al. (2000)

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DOI: 10.1002/1098-1098(2000)11:3<181::AID-IMA1003>3.0.CO;2-E

access: closed

type: Journal Article

metadata version: 2020-06-18

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Patrice Y. Simard, Yann LeCun, John S. Denker, Bernard Victorri:
Transformation invariance in pattern recognition: Tangent distance and propagation. Int. J. Imaging Syst. Technol. 11(3): 181-197 (2000)

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