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"Fully digital test solution for a set of ADCs and DACs embedded in a SIP ..."

Vincent Kerzerho et al. (2007)

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DOI: 10.1049/IET-CDT:20060136

access: closed

type: Journal Article

metadata version: 2020-07-14

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  - https://dblp.org/rec/journals/iet-cdt/KerzerhoCBACR07
Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell:
Fully digital test solution for a set of ADCs and DACs embedded in a SIP or SOC. IET Comput. Digit. Tech. 1(3): 146-153 (2007)

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