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ORCID"Bit-Error and Soft-Error Resilient 7T/14T SRAM with 150-nm FD-SOI Process."
Shusuke Yoshimoto et al. (2012)
- Shusuke Yoshimoto, Takuro Amashita, Shunsuke Okumura, Koji Nii, Masahiko Yoshimoto, Hiroshi Kawaguchi
:
Bit-Error and Soft-Error Resilient 7T/14T SRAM with 150-nm FD-SOI Process. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 95-A(8): 1359-1365 (2012)
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