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"A Study of Capture-Safe Test Generation Flow for At-Speed Testing."

Kohei Miyase et al. (2010)

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DOI: 10.1587/TRANSFUN.E93.A.1309

access: closed

type: Journal Article

metadata version: 2020-04-11

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  dblp key:
  - journals/ieicet/MiyaseWKYTFNIHAS10
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/MiyaseWKYTFNIHAS10
Kohei Miyase, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Atsushi Takashima, Hiroshi Furukawa, Kenji Noda, Hideaki Ito, Kazumi Hatayama, Takashi Aikyo, Kewal K. Saluja:
A Study of Capture-Safe Test Generation Flow for At-Speed Testing. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 93-A(7): 1309-1318 (2010)

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