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"Characterization of Germanium Nanocrystallites Grown on SiO2 by ..."
Katsunori Makihara et al. (2005)
- Katsunori Makihara, Yoshihiro Okamoto, Hideki Murakami, Seiichiro Higashi, Seiichi Miyazaki:
Characterization of Germanium Nanocrystallites Grown on SiO2 by a Conductive AFM Probe Technique. IEICE Trans. Electron. 88-C(4): 705-708 (2005)
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