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"Characterization of Resistive Switching of Pt/Si-Rich Oxide/TiN System."

Motoki Fukusima et al. (2013)

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DOI: 10.1587/TRANSELE.E96.C.708

access: closed

type: Journal Article

metadata version: 2020-04-11

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  dblp key:
  - journals/ieicet/FukusimaOMM13
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/FukusimaOMM13
Motoki Fukusima, Akio Ohta, Katsunori Makihara, Seiichi Miyazaki:
Characterization of Resistive Switching of Pt/Si-Rich Oxide/TiN System. IEICE Trans. Electron. 96-C(5): 708-713 (2013)

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