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"Complex permittivity extraction from PCB stripline measurement using ..."

Chulsoon Hwang, Woocheon Park, Dong Gun Kam (2015)

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DOI: 10.1587/ELEX.12.20150023

access: open

type: Journal Article

metadata version: 2021-02-12

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  dblp key:
  - journals/ieiceee/HwangPK15
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  - https://dblp.org/rec/journals/ieiceee/HwangPK15
Chulsoon Hwang, Woocheon Park, Dong Gun Kam:
Complex permittivity extraction from PCB stripline measurement using recessed probe launch. IEICE Electron. Express 12(5): 20150023 (2015)

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