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"An Efficient Deterministic Test Pattern Generator for Scan-Based BIST ..."

Wei-Lun Wang, Kuen-Jong Lee (2002)

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DOI: 10.1023/A:1013775922735

access: closed

type: Journal Article

metadata version: 2020-09-11

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Wei-Lun Wang, Kuen-Jong Lee:
An Efficient Deterministic Test Pattern Generator for Scan-Based BIST Environment. J. Electron. Test. 18(1): 43-53 (2002)

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