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"On Selecting Testable Paths in Scan Designs."

Yun Shao et al. (2003)

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DOI: 10.1023/A:1024648227669

access: closed

type: Journal Article

metadata version: 2020-09-11

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Yun Shao, Sudhakar M. Reddy, Irith Pomeranz, Seiji Kajihara:
On Selecting Testable Paths in Scan Designs. J. Electron. Test. 19(4): 447-456 (2003)

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