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"Guest Editorial: Test and Verification Challenges for Future ..."

Sandip Ray et al. (2013)

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DOI: 10.1007/S10836-013-5411-Y

access: open

type: Journal Article

metadata version: 2020-09-11

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Sandip Ray, Jay Bhadra, Magdy S. Abadir, Li-C. Wang:
Guest Editorial: Test and Verification Challenges for Future Microprocessors and SoC Designs. J. Electron. Test. 29(5): 621-623 (2013)

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