"Impact of Body Bias on Delay Fault Testing of Sub-100 nm CMOS Circuits."

Bipul C. Paul, Kaushik Roy (2006)

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DOI: 10.1007/S10836-006-7427-Z

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type: Journal Article

metadata version: 2020-09-11

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Bipul C. Paul, Kaushik Roy:
Impact of Body Bias on Delay Fault Testing of Sub-100 nm CMOS Circuits. J. Electron. Test. 22(2): 115-124 (2006)

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