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"Statistical Tolerance Analysis for Assured Analog Test Coverage."

Sule Ozev, Alex Orailoglu (2003)

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DOI: 10.1023/A:1022893724851

access: closed

type: Journal Article

metadata version: 2020-09-11

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Sule Ozev, Alex Orailoglu:
Statistical Tolerance Analysis for Assured Analog Test Coverage. J. Electron. Test. 19(2): 173-182 (2003)

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