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"Testing and Diagnosis Methodologies for Embedded Content Addressable Memories."

Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu (2003)

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DOI: 10.1023/A:1022858128485

access: closed

type: Journal Article

metadata version: 2023-10-17

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Jin-Fu Li, Ruey-Shing Tzeng, Cheng-Wen Wu:
Testing and Diagnosis Methodologies for Embedded Content Addressable Memories. J. Electron. Test. 19(2): 207-215 (2003)

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