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"An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology."
Qingyu Chen et al. (2016)
- Qingyu Chen, Haibin Wang, Li Chen, Lixiang Li, Xing Zhao, Rui Liu, Mo Chen, Xuantian Li:
An SEU-Resilient SRAM Bitcell in 65-nm CMOS Technology. J. Electron. Test. 32(3): 385-391 (2016)
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