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"Fault Models and Test Generation for OpAmp Circuits - The FFM."

José Vicente Calvano et al. (2001)

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DOI: 10.1023/A:1011169626409

access: closed

type: Journal Article

metadata version: 2020-09-11

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  - https://dblp.org/rec/journals/et/CalvanoFAL01
José Vicente Calvano, Antonio Carneiro de Mesquita Filho, Vladimir Castro Alves, Marcelo Lubaszewski:
Fault Models and Test Generation for OpAmp Circuits - The FFM. J. Electron. Test. 17(2): 121-138 (2001)

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