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ORCID"A Selective Scan Slice Encoding Technique for Test Data Volume and Test ..."
Nabil Badereddine et al. (2008)
- Nabil Badereddine, Zhanglei Wang, Patrick Girard, Krishnendu Chakrabarty
, Arnaud Virazel, Serge Pravossoudovitch, Christian Landrault:
A Selective Scan Slice Encoding Technique for Test Data Volume and Test Power Reduction. J. Electron. Test. 24(4): 353-364 (2008)
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