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"Yield and Reliability Improvement Techniques for Emerging Nonvolatile ..."

Wang Kang et al. (2015)

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DOI: 10.1109/JETCAS.2014.2374291

access: closed

type: Journal Article

metadata version: 2023-10-02

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Wang Kang, Liuyang Zhang, Weisheng Zhao, Jacques-Olivier Klein, Youguang Zhang, Dafine Ravelosona, Claude Chappert:
Yield and Reliability Improvement Techniques for Emerging Nonvolatile STT-MRAM. IEEE J. Emerg. Sel. Topics Circuits Syst. 5(1): 28-39 (2015)

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