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"Randomized Polynomial Time Identity Testing for Noncommutative Circuits."

Vikraman Arvind, Partha Mukhopadhyay, Raja S (2016)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2023-06-02

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  - electronic edition @ weizmann.ac.il (open access)
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  dblp key:
  - journals/eccc/ArvindMS16
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  persistent URL:
  - https://dblp.org/rec/journals/eccc/ArvindMS16
Vikraman Arvind, Partha Mukhopadhyay, Raja S:
Randomized Polynomial Time Identity Testing for Noncommutative Circuits. Electron. Colloquium Comput. Complex. TR16 (2016)

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