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"Reliability Implications of Bias-Temperature Instability in Digital ICs."

Sang Phill Park, Kunhyuk Kang, Kaushik Roy (2009)

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DOI: 10.1109/MDT.2009.154

access: closed

type: Journal Article

metadata version: 2020-05-17

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  dblp key:
  - journals/dt/ParkKR09
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  persistent URL:
  - https://dblp.org/rec/journals/dt/ParkKR09
Sang Phill Park, Kunhyuk Kang, Kaushik Roy:
Reliability Implications of Bias-Temperature Instability in Digital ICs. IEEE Des. Test Comput. 26(6): 8-17 (2009)

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