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"Guiding Deep Learning System Testing using Surprise Adequacy."

Jinhan Kim, Robert Feldt, Shin Yoo (2018)

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DOI: —

access: open

type: Informal or Other Publication

metadata version: 2018-09-02

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  - electronic edition @ arxiv.org (open access)
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  dblp key:
  - journals/corr/abs-1808-08444
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  persistent URL:
  - https://dblp.org/rec/journals/corr/abs-1808-08444
Jinhan Kim, Robert Feldt, Shin Yoo:
Guiding Deep Learning System Testing using Surprise Adequacy. CoRR abs/1808.08444 (2018)

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